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Home :: AFM :: PICOStation

  ULTRAObjective

NANOStation II

NANOStation 300

NANOStation HD

PICOStation

SCANControl C







PICOStation

The stages are made of granite, a material with superior thermal behavior. Driven by high precision micrometer screws an exact positioning of the sample is provided. After reaching the measuring position on the sample the stage can be completely decoupled from the driving micrometer screws by simply turning them a few micrometers back. Thus, the granite stage elements are in direct contact over the entire running surface. This explains the superior drift - free behavior of this proprietary design. The straightforward, yet vibration insensitive stand provides the ideal setup for high accuracy AFM/SPM measurements down to a true atomic level.


Specifications of the PICOStation

Scan range: 20 µm x 20 µm x 3 µm
40 µm x 40 µm x 4 µm
80 µm x 80 µm x 5 µm
hardware linearized scan
motion in X-Y-direction
(optional in Z-direction)
Digital input resolution: 16 bit A/D
Noise level: 0.05 nm rms in vertical direction (Z) Digital output resolution: 16 bit A/D
Lateral accuracy: typically within 1%, closed loop scanning Output voltage: ± 165 V, mit 2 µV rms
Vertical resolution: < 0.1 nm Input channels: max. 8 simultaneous
Scan speed: typ. 1 to 10 Hz Exteral inputs: max. 3 high speed with 16 bit resolution
Detection principle: fiber optic interferometry, noise level < 0.01 nm rms Image size: freely selectable, from 128 to 1024 pixels, even rectangular sizes
Tips: silicon tips, various types Processing: internal 32 bit DSP, typ. 50 MHz
Tip change: adjustment free Computer interface: USB (standard universal serial bus)

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Last updated
Dec 17, 2007