ULTRAObjective® is a classical aproach in combining both, the ease of use in optical microscopy with the resolution of SPM, thus making this technique avaible to a wide variety of industrial application. The measuring head of the ULTRAObjective is a complete AFM / SPM whose size takes up the same space as a normal optical objective.

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The NANOStation® II combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up. The combination of the S.I.S. ULTRAObjective® AFM / SPM and a high power optical microscope on a highly rigid granite stand makes the NANOStation® II a highly effective and exceptionally versatile inspection system.

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The new NANOStation® 300 air-bearing stage for nanometer scale inspection of 300mm wafers, masks and other large samples is the result of more than a decade in AFM/SPM development.

The system is designed to provide highest stability and precision in surface measuring applications. The single plane architecture with the rigid granite base provides significant advantages over multi-component metal-made translation systems. Higher strength, smaller thermal expansion and lower mass enables rapid postioning with great accuracy.

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NANOStation HD is the highest resolution tool for Hard Disk/DVD/CD and circular sample inspection. It combines a high quality optical microscope, a scriber tool and a state-of-the-art AFM: The S.I.S.- ULTRAObjective!

Now you localize the defect with the optical microscope, push one button and the sample is positioned beneath the AFM; one more button and the measurement is executed. In addition you can mark any feature you find by using the scriber.

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The PICOStation is a compact and highly rigid stand for the ULTRAObjective® AFM/SPM system. Equipped with a ultra precision vertical stage the AFM is approached with nanometer accuracy. Sophisticated algorithms provide a smooth and gentle probe approach. Accidental tip to sample contacts in non - contact measurement approaches belong to the past. Unique sliding X - Y stages provide the highest possible rigidity.

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The SCANControl C is the latest improvement to the tried and trusted SCANControl electronics for the S.I.S. scanning probe measuring heads (“ULTRAObjective®”). The modern circuit design and use of programmable logic makes the SCANControl C not only the most precise, but also the most versatile SPM controller.

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